DLA - SMD-5962-94734
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 3 April 1995 |
| Status: | inactive |
| Page Count: | 35 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number 1/ Circuit function Access time 01 16 M × 1, DYNAMIC RAM, 32 ms refresh 100 ns 02 16 M × 1, DYNAMIC RAM, 32 ms refresh 80 ns 03 16 M × 1, DYNAMIC RAM, 32 ms refresh 70 ns
The device class designator shall be a single letter identifying the product assurance level (see 6.7 herein) as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535
The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style X See figure 1 28 flat pack Y See figure 1 28/24 leadless chip carrier
The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Voltage range on any pin - - - - - - - - - - - - - - - - - - - - - −1 V dc to 7 V dc Voltage range on VCC - - - - - - - - - - - - - - - - - - - - - - - −1 V dc to 7 V dc Short circuit output current - - - - - - - - - - - - - - - - - - - 50 mA Maximum power dissipation (PD) - - - - - - - - - - - - - - - - - - 1 W Storage temperature range - - - - - - - - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - - - - - - - - - +300°C Thermal resistance, junction-to-case (θJC) Case outlines X and Y - - - - - - - - - - - - - - - - - - - - - 15°C/W 3/ Junction temperature (TJ) 4/ - - - - - - - - - - - - - - - - - - - +175°C
Supply voltage range (VCC) 5/ - - - - - - - - - - - +4.5 V dc to +5.5 V dc High-level input voltage (VIH) - - - - - - - - - - - 2.4 V dc minimum to 6.5 V dc maximum Low-level input voltage (VIL) 6/ - - - - - - - - - −1.0 V dc minimum to 0.8 V dc maximum Case operating temperature range (TC) - - - - - - - −55°C to +125°C Transition times, [R bar][A bar][S bar] and [C bar][A bar][S bar] (rise and fall) - - - 3 ns minimum to 30 ns maximum
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - 7/ percent
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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