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DLA - SMD-5962-94734

MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 3 April 1995
Status: inactive
Page Count: 35
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number 1/ Circuit function Access time 01 16 M × 1, DYNAMIC RAM, 32 ms refresh 100 ns 02 16 M × 1, DYNAMIC RAM, 32 ms refresh 80 ns 03 16 M × 1, DYNAMIC RAM, 32 ms refresh 70 ns

The device class designator shall be a single letter identifying the product assurance level (see 6.7 herein) as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X See figure 1 28 flat pack Y See figure 1 28/24 leadless chip carrier

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Voltage range on any pin - - - - - - - - - - - - - - - - - - - - - −1 V dc to 7 V dc Voltage range on VCC - - - - - - - - - - - - - - - - - - - - - - - −1 V dc to 7 V dc Short circuit output current - - - - - - - - - - - - - - - - - - - 50 mA Maximum power dissipation (PD) - - - - - - - - - - - - - - - - - - 1 W Storage temperature range - - - - - - - - - - - - - - - - - - - - −65°C to +150°C Lead temperature (soldering, 10 seconds) - - - - - - - - - - - - - +300°C Thermal resistance, junction-to-case (θJC) Case outlines X and Y - - - - - - - - - - - - - - - - - - - - - 15°C/W 3/ Junction temperature (TJ) 4/ - - - - - - - - - - - - - - - - - - - +175°C

Supply voltage range (VCC) 5/ - - - - - - - - - - - +4.5 V dc to +5.5 V dc High-level input voltage (VIH) - - - - - - - - - - - 2.4 V dc minimum to 6.5 V dc maximum Low-level input voltage (VIL) 6/ - - - - - - - - - −1.0 V dc minimum to 0.8 V dc maximum Case operating temperature range (TC) - - - - - - - −55°C to +125°C Transition times, [R bar][A bar][S bar] and [C bar][A bar][S bar] (rise and fall) - - - 3 ns minimum to 30 ns maximum

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - - - - 7/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

September 8, 2023
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16MEG X 1 DRAM, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
April 17, 2013
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16MEG X 1 DRAM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class M and Q). A choice of case outlines and lead finishes are...
SMD-5962-94734
April 3, 1995
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16 MEG X 1 DRAM, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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