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DLA - SMD-5962-96889

MICROCIRCUIT DIE, MEMORY, DIGITAL, CMOS, 4M X 1 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 15 October 1996
Status: inactive
Page Count: 22
scope:

This drawing establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high-reliability (device class Q) and space application (device class V) are reflected in the Part or Identification Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels shall be reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes Q and V RHA identified die shall meet the MIL-PRF-38535 specified RHA levels. A dash (-)indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function Access time 01 MT4C1004JD37M 4 MEG × 1 DRAM Die(5 V) 60 ns 02 MT4C1004JD37M 4 MEG × 1 DRAM Die(5 V) 70 ns

The device class designator shall be a single letter identifying the die's product assurance level as follows:

Die class Die requirements documentation Q or V Certification and qualification to die requirements of MIL-PRF-38535

The die details designator shall be a unique letter which identifies the die's physical dimensions, bonding pad location(s) and related electrical function(s), interface materials, and other assembly related information for each product and variant supplied to this drawing.

Die Type Figure number 01 1 02 1

Die type Figure number 01 1 02 1

Die type Figure number 01 1 02 1

Die type Figure number 01 1 02 1

Voltage on any pin relative to VSS........... −1 V to + 7 V Operating Temperature TA ambient............. 0°C to 70°C Storage temperature ......................... −55°C to +150°C Power Dissipation ........................... 1 W Short circuit output current ................ 50 mA

Supply voltage............................... 4.5 V to 5.5 V

Unless otherwise specified, the following specification, standards, bulletin, and handbook of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the solicitation, form a part of this drawing to the extent specified herein.

SPECIFICATION MILITARY MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. STANDARDS MILITARY MIL-STD-883 - Test Methods and Procedures for Microelectronics. MIL-STD-973 - Configuration management HANDBOOK MILITARY MIL-HDBK-103 - List of Standard Microcircuit Drawings (SMD's). MIL-HDBK-780 - Standard Microcircuit Drawings.

(Copies of the specification, standards, bulletin, and handbook required by manufacturers in connection with specific acquisition functions should be obtained from the contracting activity or as directed by the contracting activity.)

In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing shall take precedence.

intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for Government microcircuit applications (original... View More

Document History

October 1, 2014
MICROCIRCUIT DIE, MEMORY, DIGITAL, CMOS, 4M X 1 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
April 5, 2006
MICROCIRCUIT DIE, MEMORY, DIGITAL, CMOS, 4M X 1 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON
This drawing establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
SMD-5962-96889
October 15, 1996
MICROCIRCUIT DIE, MEMORY, DIGITAL, CMOS, 4M X 1 DYNAMIC RANDOM ACCESS MEMORY (DRAM), MONOLITHIC SILICON
This drawing establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...

References

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