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ISO 16700

Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification

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Organization: ISO
Publication Date: 15 March 2004
Status: inactive
Page Count: 24
ICS Code (Optical equipment): 37.020

Document History

August 1, 2016
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is...
ISO 16700
March 15, 2004
Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
A description is not available for this item.

References

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