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ISO 16700

Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification

inactive
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Organization: ISO
Publication Date: 15 March 2004
Status: inactive
Page Count: 24
ICS Code (Optical equipment): 37.020

Document History

ISO 16700
August 1, 2016
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is...
ISO 16700
March 15, 2004
Microbeam analysis Scanning electron microscopy Guidelines for calibrating image magnification
A description is not available for this item.

References

This document is referenced by:
IEC/TS 62622 - Nanotechnologies – Description, measurement and dimensional quality parameters of artificial gratings
Published by IEC on October 1, 2012
This technical specification specifies the generic terminology for the global and local quality parameters of artificial gratings, interpreted in terms of deviations from nominal positions of grating...
This document is referenced by:
BS DD ISO/TS 10798 - Nanotechnologies - Charaterization of singlewall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Published by BSI on July 31, 2011
A description is not available for this item.
This document is referenced by:
DIN IEC/TS 62622 - Nanotechnologies - Description, measurement and dimensional quality parameters of artificial gratings (IEC/TS 62622:2012)
Published by DIN on September 1, 2014
Diese Technische Spezifikation legt eine generische Terminologie für die globalen und lokalen Qualitätsparameter von künstlichen Gittern, die als Abweichungen von den nominalen Positionen der...
This document is referenced by:
BS DD ISO/TS 12805 - Nanotechnologies - Materials specifications - Guidance on specifying nano-objects
Published by BSI on November 30, 2011
A description is not available for this item.
This document is referenced by:
BS EN 1071-10 - Advanced technical ceramics - Methods of test for ceramic coatings Part 10: Determination of coating thickness by cross sectioning
Published by BSI on August 31, 2009
A description is not available for this item.
This document is referenced by:
BS ISO 22309 - Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
Published by BSI on October 31, 2011
A description is not available for this item.
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