DLA - SMD-5962-91697 REV B
MICROCIRCUIT, DIGITAL, CHMOS SINGLE-CHIP, 8-BIT MICROCONTROLLER WITH 32K BYTES OF EPROM PROGRAM MEMORY, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 3 September 1996 |
| Status: | inactive |
| Page Count: | 33 |
scope:
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment.
The PIN is as shown in the following example:
Device classes N, Q, and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) identify the circuit function as follows:
Device type Generic number Circuit function 01 87C51FC High performance CHMOS single chip 8-bit microcontroller with 32K bytes user programmable EPROM 02 87C51FC-16 High performance CHMOS single-chip 8-bit microcontroller with 32K bytes user programmable EPROM 03 87C51FC High performance CHMOS single chip 8-bit microcontroller with 32K bytes user programmable EPROM 04 87C51FC-16 High performance CHMOS single-chip 8-bit microcontroller with 32K bytes user programmable EPROM
The device class designator is a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A N Certification and qualification to MIL-PRF-38535 with a nontraditional performance environment 1/ Q or V Certification and qualification to MIL-PRF-38535
The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style M GQCC1-J44 44 Ceramic chip carrier, J-leaded package 2/ T See figure 1 44 Ceramic chip carrier, J-leaded package 2/ U CQCC1-N44 44 Square chip carrier package 2/ X CDIP2-T40 or GDIP1-T40 40 Dual-in-line package 2/ Z See figure 1 44 Ceramic chip carrier, gullwing-leaded package 2/ Y MS-018-AC 3/ 44 Plastic chip carrier, J-leaded N MS-011-AC 3/ 40 Plastic dual-in-line package
The lead finish is as specified in MIL-PRF-38535 for device classes N, Q, and V or MIL-PRF-38535, appendix A for device class M.
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −65°C to +150°C Voltage on EA/VPP pin to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.0 V dc to +13.0 V dc Voltage on any other pin to VSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −0.5 V dc to +6.5 V dc Maximum IOL per I/O pin . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 mA Power dissipation (PD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.5 W 5/ Lead temperature (soldering 10 seconds) . . . . . . . . . . . . . . . . . . . . . . . . . 265°C Thermal resistance, junction-to-case (ΘJC): Cases U, X and M . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See MIL-STD-1835 Cases T, Z and N . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14°C/W Cases Y . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15°C/W Endurance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 cycles/byte, minimum Data retention . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 years, minimum
Case Operating Temperature Range devices 01, 02 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −55°C to +125°C 6/ devices 03, 04 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . −40°C to +85°C 6/ Supply Voltage, Vcc . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5.0 V dc ± 20% Oscillator frequency . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.5 MHz to 16 MHz
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . . . . . . . . . . . . . . . . . XX percent 7/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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