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DLA - SMD-5962-95669

MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 9 November 1995
Status: inactive
Page Count: 16
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and space application (device class V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device class M RHA marked devices shall meet the MIL-I-38535 appendix A specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 HS-2420RH Radiation hardened, D.I., sample and hold amplifier

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style C GDIP1-T14 14 Dual-in-line

The lead finish shall be as specified in MIL-STD-883 (see 3.1 herein) for class M or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Voltage between +VS and −VS . . . . . . . . . . . . . . +40 V Differential input voltage (VIND) . . . . . . . . . . . ±24 V Digital input voltage (S/H pin) . . . . . . . . . . . . +8 V, −15 V Output current . . . . . . . . . . . . . . . . . . . . Short circuit protected Maximum package dissipation (PD) . . . . . . . . . . . 1.03 W at +75°C 2/ Junction temperature (TJ) . . . . . . . . . . . . . . . +175°C Storage temperature range . . . . . . . . . . . . . . . −65°C to +150°C Lead temperature (soldering, 10 seconds) . . . . . . . +275°C Thermal resistance, junction-to-case (ΘJC) . . . . . . See MIL-STD-1835 Thermal resistance, junction-to-ambient (ΘJA) . . . . . 96°C/W

Supply voltage range (±VS) . . . . . . . . . . . . . . ±15 V Analog input voltage . . . . . . . . . . . . . . . . . ±10 V Low input voltage (VIL) . . . . . . . . . . . . . . . . 0 V to 0.8 V, maximum High input voltage (VIH) . . . . . . . . . . . . . . . 2.0 V to 5.0 V Ambient operating temperature range (TA) . . . . . . . −55°C to +125°C Radiation features: 3/ Neutron . . . . . . . . . . . . . . . . . . . . . . . 4/ Total dose . . . . . . . . . . . . . . . . . . . . . > 100 Krads (Si) Latch up . . . . . . . . . . . . . . . . . . . . . . None 5/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

March 4, 2021
MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
February 25, 2015
MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
October 5, 2005
MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
June 30, 1999
MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
April 4, 1997
MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-95669
November 9, 1995
MICROCIRCUIT, LINEAR, RADIATION HARDENED, SAMPLE AND HOLD AMPLIFIER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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