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DLA - SMD-5962-96641 REV C

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD 2-INPUT NAND SCHMITT TRIGGER, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 2 July 2003
Status: active
Page Count: 21
scope:

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD-5962-96641 REV C
July 2, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD 2-INPUT NAND SCHMITT TRIGGER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 8, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD 2-INPUT NAND SCHMITT TRIGGER, MONOLITHIC SILICON
A description is not available for this item.
April 4, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD 2-INPUT NAND SCHMITT TRIGGER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 27, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD 2-INPUT NAND SCHMITT TRIGGER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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