JEDEC JESD 24-1
Method for Measurement of Power Device Turn-Off Switching Loss
|Publication Date:||1 October 1989|
Describes the method of a typical oscilloscope waveform and the basic test circuit employed in the measurement of turn off loss for bipolar, IGBT and MOSFET power semiconductors. This method can be used as a standard for evaluating power semiconductor turn-off switching loss capability and defines standard terminology that should be referenced within the electronic industry.