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JEDEC - J-STD-035

Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

inactive
Organization: JEDEC
Publication Date: 1 April 1999
Status: inactive
Page Count: 17
scope:

This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic components. This method provides users with an acoustic microscopy process reflow for detecting defects non-destructively in plastic packages while achieving reproducibility.

Document History

December 1, 2022
Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Devices
This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic devices. This method provides users with an acoustic microscopy process flow for...
May 1, 1999
Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
This test method defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for...
J-STD-035
April 1, 1999
Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic components. This method provides users with an acoustic microscopy process reflow...
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