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NPFC - MIL-M-38510/329

MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 22 August 1983
Status: inactive
Page Count: 15
scope:

This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number.

The part number shall be in accordance with MIL-M-38510, and as specified herein.

The device type shall be as follows:

Device type Circuit 01 9-bit odd/even parity generator/checker

The device class shall be the product assurance level as defined in MIL-M-38510.

The case outline shall be designated as follows:

Outline letter Case outline (see MIL-M-38510, appendix C) A F-1 (14-lead, ¼" × ¼") flat package B F-3 (14-lead, 3/16" × ¼"), flat package C D-1 (14-lead, ¼" × ¾"), dual-in-line package D F-2 (14-lead, ¼" × ⅜"), flat package X C-2 (20-terminal, .350" × .350"), square chip carrier package

Supply voltage range - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Input voltage range - - - - - - - - - - - - −1.5 V dc at −18 mA to +5.5 V dc Storage temperature range - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) 1/ - - - - - 148.5 mW Lead temperature (soldering, 10 seconds) - - +300°C Thermal resistance, junction-to-case (OJC): Cases A, B, and D- - - - - - - - - - - - - 70°C/W Case C - - - - - - - - - - - - - - - - - - 50°C/W Case X - - - - - - - - - - - - - - - - - - 60°C/W Junction temperature (TJ)- - - - - - - - - - +175°C

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Rome Air Development Center (RBE-2), Griffiss AFB, NY 13441, by using the self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.

Supply voltage range (VCC) - - - - - - - - +4.5 V dc minimum to +5.5 V dc maximum Minimum high-level input voltage (VIH) - - +2.0 V dc Maximum low-level input voltage (VIL)- - - +0.7 V dc Normalized fanout (each output)- - - - - - 10 maximum Case operating temperature range (TC)- - - −55°C to +125°C

intended Use:

Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.

Document History

Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
August 23, 2013
Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
November 13, 2008
Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Parity Checker, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and...
October 16, 2003
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and...
July 3, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
April 18, 1997
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
May 11, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/329
August 22, 1983
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and...
July 6, 1982
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
December 18, 1978
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
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