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NPFC - MIL-M-38510/329

MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 11 May 1987
Status: inactive
Page Count: 2

Document History

MIL-M-38510/329B VALID NOTICE 3
June 9, 2023
Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/329
August 23, 2013
Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Parity Checker, Monolithic Silicon
A description is not available for this item.
MIL-M-38510/329
November 13, 2008
Microcircuits, Digital, Bipolar, Low-Power Schottky TTL, Parity Checker, Monolithic Silicon
This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/329
October 16, 2003
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/329
July 3, 2002
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/329
April 18, 1997
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/329
May 11, 1987
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/329
August 22, 1983
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, low-power Schottky TTL, parity checker logic microcircuit. Two product assurance classes and a choice of case outlines and...
MIL-M-38510/329 (1)
July 6, 1982
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/329
December 18, 1978
MICROCIRCUITS, DIGITAL, BIPOLAR, LOW-POWER SCHOTTKY TTL, PARITY CHECKER, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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