DS/EN 61967-4
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method
active, Most Current
Buy Now
| Organization: | DS |
| Publication Date: | 9 July 2002 |
| Status: | active |
| Page Count: | 35 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 61967 specifies a method to measure the conducted electromagentic emission (EME) of integrated circuits by direct radion frequency (RF) current measurement with a 1 ohm resitive probe and RF voltage measurement using a 150 ohm coupling network. These methods quarantee a high degree of repeatability and correlation of EME measurements.
Document History
July 31, 2017
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method
This part of IEC 61967 specifies a method to measure the conducted electromagentic emission (EME) of integrated circuits by direct radion frequency (RF) current measurement with a 1 ohm resitive...
March 31, 2006
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm...
DS/EN 61967-4
July 9, 2002
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions – 1 ohm/150 ohm direct coupling method
This part of IEC 61967 specifies a method to measure the conducted electromagentic emission (EME) of integrated circuits by direct radion frequency (RF) current measurement with a 1 ohm resitive...
Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
References
Related Products
Searching for related products...