JEDEC JESD 284
Test Methods for the Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance
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| Organization: | JEDEC |
| Publication Date: | 1 November 1963 |
| Status: | active |
| Page Count: | 9 |
scope:
The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November 1963). Became JESD284-A when reaffirmed in October 2002.
Document History
JEDEC JESD 284
November 1, 1963
Test Methods for the Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance
The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November...
January 1, 1963
Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for
A description is not available for this item.
January 1, 1963
Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for
A description is not available for this item.
January 1, 1963
Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for
The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November...
References
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