UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

JEDEC - EIA-284-A

Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for

inactive
Organization: JEDEC
Publication Date: 1 January 1963
Status: inactive
scope:

The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November 1963). Became JESD284-A when reaffirmed in October 2002.

Document History

November 1, 1963
Test Methods for the Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance
The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November...
284
January 1, 1963
Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for
A description is not available for this item.
January 1, 1963
Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for
A description is not available for this item.
EIA-284-A
January 1, 1963
Collector-Base Time Constant and for the Resistive Part of the Common-Emitter Input Impedance, Test Methods for
The test methods described in this Standard are generally applicable to alloy-like devices for which the usual simplified equivalent circuits can be employed. Formerly known as EIA-284-A (November...
Advertisement