ASTM International - ASTM F1996-01
Standard Test Method for Silver Migration for Membrane Switch Circuitry
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| Organization: | ASTM International |
| Publication Date: | 10 June 2001 |
| Status: | inactive |
| Page Count: | 2 |
| ICS Code (Other non-ferrous metals and their alloys): | 77.120.99 |
scope:
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
Document History
October 1, 2014
Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces....
July 1, 2006
Standard Test Method for Silver Migration for Membrane Switch Circuitry
The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.
Accelerated...
June 10, 2001
Standard Test Method for Silver Migration for Membrane Switch Circuitry
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur...
ASTM F1996-01
June 10, 2001
Standard Test Method for Silver Migration for Membrane Switch Circuitry
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur...
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