ASTM International - ASTM F1996-14
Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
inactive
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| Organization: | ASTM International |
| Publication Date: | 1 October 2014 |
| Status: | inactive |
| Page Count: | 3 |
| ICS Code (Other non-ferrous metals and their alloys): | 77.120.99 |
significance And Use:
4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive... View More
scope:
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
Document History
ASTM F1996-14
October 1, 2014
Standard Test Method for Silver Migration for Membrane Switch Circuitry (Withdrawn 2023)
4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces....
July 1, 2006
Standard Test Method for Silver Migration for Membrane Switch Circuitry
The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.
Accelerated...
June 10, 2001
Standard Test Method for Silver Migration for Membrane Switch Circuitry
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur...
June 10, 2001
Standard Test Method for Silver Migration for Membrane Switch Circuitry
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur...
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