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ASTM International - ASTM F676-97(2003)

Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)

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Organization: ASTM International
Publication Date: 10 December 1997
Status: inactive
Page Count: 3
significance And Use:

Unsaturated sink current is a special parameter that is closely related to the gain of the output transistor of TTL circuits. This parameter is particularly useful in evaluating neutron... View More

scope:

1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.

1.2 Units-The values stated in the International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

ASTM F676-97(2003)
December 10, 1997
Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions. 1.2 Units—The values stated in the International...
January 1, 1993
Standard Test Method for Measuring Unsaturated TTL Sink Current
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions. 1.2 This standard does not purport to address all...
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