ASTM International - ASTM F676-97
Standard Test Method for Measuring Unsaturated TTL Sink Current
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| Organization: | ASTM International |
| Publication Date: | 1 January 1993 |
| Status: | inactive |
| Page Count: | 3 |
| ICS Code (Transistors): | 31.080.30 |
scope:
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transisto
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Document History
December 10, 1997
Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
1.2 Units—The values stated in the International...
ASTM F676-97
January 1, 1993
Standard Test Method for Measuring Unsaturated TTL Sink Current
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
1.2 This standard does not purport to address all...
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