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ASTM International - ASTM E1523-09

Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy

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Organization: ASTM International
Publication Date: 1 May 2009
Status: inactive
Page Count: 7
ICS Code (Physicochemical methods of analysis): 71.040.50
significance And Use:

The acquisition of chemical information from variations in the energy position of peaks in the XPS spectrum is of primary interest in the use of XPS as a surface analytical tool. Surface charging... View More

scope:

1.1 This guide acquaints the X-ray photoelectron spectroscopy (XPS) user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of XPS data from surfaces of insulating specimens and provides information needed for reporting the methods used to customers or in the literature.

1.2 This guide is intended to apply to charge control and charge referencing techniques in XPS and is not necessarily applicable to electron-excited systems.

1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

June 1, 2015
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
5.1 The acquisition of chemical information from variations in the energy position of peaks in the XPS spectrum is of primary interest in the use of XPS as a surface analytical tool. Surface charging...
ASTM E1523-09
May 1, 2009
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
The acquisition of chemical information from variations in the energy position of peaks in the XPS spectrum is of primary interest in the use of XPS as a surface analytical tool. Surface charging...
May 10, 2003
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
The acquisition of chemical information from variations in the energy position of peaks in the XPS spectrum is of primary interest in the use of XPS as a surface analytical tool. Surface charging...
September 10, 1997
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
1.1 This guide covers the acquainting of the XPS user with the various charge control and charge shift referencing techniques that are and have been used in the acquisition and interpretation of...
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