UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

ASTM International - ASTM E1127-91(1997)

Standard Guide for Depth Profiling in Auger Electron Spectroscopy

inactive
Buy Now
Organization: ASTM International
Publication Date: 10 September 1997
Status: inactive
Page Count: 4
ICS Code (Physicochemical methods of analysis): 71.040.50
scope:

1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.

1.2 Guidelines are given for depth profiling by the following:

Section Ion Sputtering 6 Angle Lapping and Cross-Sectioning 7 Mechanical Cratering 8 Nondestructive Depth Profiling 9

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Document History

June 1, 2015
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy. 1.2 Guidelines are given for depth profiling by the following:   Section Ion Sputtering  6 Angle...
October 1, 2008
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy. 1.2 Guidelines are given for depth profiling by the following: Section Ion Sputtering 6 Angle Lapping...
May 10, 2003
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Auger electron spectroscopy yields information concerning the chemical and physical state of a solid surface in the near surface region. Nondestructive depth profiling is limited to this near surface...
ASTM E1127-91(1997)
September 10, 1997
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy. 1.2 Guidelines are given for depth profiling by the following: Section Ion Sputtering 6 Angle Lapping and...
Advertisement