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NPFC - MIL-M-38510/46

MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 31 July 1989
Status: active
Page Count: 1

Document History

MIL-M-38510/46B CANC NOTICE 2
October 4, 2001
MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/46
July 31, 1989
MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/46
March 21, 1984
MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
Microcircuits conforming to this specification are intended for logistic support of existing equipment.
MIL-M-38510/46
May 24, 1982
MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/46
July 19, 1976
MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/46
February 13, 1976
MICROCIRCUITS, DIGITAL, TTL, LOW POWER, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-M-38510 - MICROCIRCUITS, GENERAL SPECIFICATION FOR
Published by NPFC on August 27, 1993
A description is not available for this item.
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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