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DLA - SMD-5962-96629 REV B

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, DUAL J-K MASTER SLAVE FLIP-FLOP, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 29 July 1997
Status: inactive
Page Count: 26

Document History

January 31, 2020
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, DUAL J-K MASTER SLAVE FLIP-FLOP, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes...
August 23, 2010
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, DUAL J-K MASTER SLAVE FLIPFLOP, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 11, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, DUAL J-K MASTER SLAVE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96629 REV B
July 29, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, DUAL J-K MASTER SLAVE FLIP-FLOP, MONOLITHIC SILICON
A description is not available for this item.
February 24, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, DUAL J-K MASTER SLAVE FLIP-FLOP, MONOLITHIC SILICON
Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original...
January 4, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, DUAL J-K MASTER SLAVE FLIP-FLOP, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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