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BSI - BS EN 60512-6-2

Connectors for Electronic Equipment - Tests and Measurements - Part 6-2: Dynamic Stress Tests - Test 6b: Bump

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Organization: BSI
Publication Date: 5 June 2002
Status: active
Page Count: 10
ICS Code (Electromechanical components in general): 31.220.01
ICS Code (Plug-and-socket devices. Connectors): 31.220.10

Document History

BS EN 60512-6-2
June 5, 2002
Connectors for Electronic Equipment - Tests and Measurements - Part 6-2: Dynamic Stress Tests - Test 6b: Bump
A description is not available for this item.

References

This document references:
IEC 60512-2-1 - Connectors for Electronic Equipment; Tests and Measurements - Part 2-1: Electrical Continuity and Contact Resistance Tests - Test 2a: Contact Resistance - Millivolt Level Method
Published by IEC on February 1, 2002
Scope and object This part of IEC 60512, when required by the detail specification, is used for testing electromechanical components within the scope of IEC technical committee 48. This test may also...
This document references:
IEC 60512-2-5 - Connectors for electronic equipment Tests and measurements Part 2-5: Electrical continuity and contact resistance tests Test 2e: Contact disturbance
Published by IEC on May 1, 2003
A description is not available for this item.
This document references:
IEC 60512-1-1 - Connectors for Electronic Equipment - Tests and Measurements - Part 1-1: General Examination - Test 1a: Visual Examination
Published by IEC on February 1, 2002
A description is not available for this item.
This document references:
EN 60068-2-29 - Basic Environmental Testing Procedures Part 2: Tests Test Eb and Guidance: Bump
Published by CENELEC on January 1, 1993
A description is not available for this item.
This document references:
EN 60512-1-1 - Connectors for Electronic Equipment - Tests and Measurements Part 1-1: General Examination - Test 1a: Visual Examination
Published by CENELEC on April 1, 2002
A description is not available for this item.
This document references:
EN 60512-2-1 - Connectors for Electronic Equipment Tests and Measurements Part 2-1: Electrical Continuity and Contact Resistance Tests Test 2a: Contact Resistance Millivolt Level Method
Published by CENELEC on April 1, 2002
A description is not available for this item.
This document is referenced by:
BS EN 50173-1 - Information technology - Generic cabling systems Part 1: General requirements
Published by BSI on June 30, 2018
A description is not available for this item.
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