DLA - DSCC-VID-V62/04731
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTERS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 9 June 2004 |
| Status: | inactive |
| Page Count: | 20 |
Document History
August 22, 2011
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTERS, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance 3.3-V ABT scan test device with 18-bit transceiver and registers microcircuit, with an operating temperature range of -40°C to...
DSCC-VID-V62/04731
June 9, 2004
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTERS, MONOLITHIC SILICON
A description is not available for this item.