IEC 60749-29
Semiconductor devices Mechanical and climatic test methods Part 29:Latch-up test
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| Organization: | IEC |
| Publication Date: | 1 November 2003 |
| Status: | inactive |
| Page Count: | 50 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
April 1, 2011
Semiconductor devices – Mechanical and climatic test methods – Part 29: Latch-up test
Scope and object
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.
This test is classified as destructive.
The purpose of this test is to...
IEC 60749-29
November 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 29:Latch-up test
A description is not available for this item.