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IEC 60749-29

Semiconductor devices Mechanical and climatic test methods Part 29:Latch-up test

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Organization: IEC
Publication Date: 1 November 2003
Status: inactive
Page Count: 50
ICS Code (Semiconductor devices): 31.080

Document History

April 1, 2011
Semiconductor devices – Mechanical and climatic test methods – Part 29: Latch-up test
Scope and object This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to...
IEC 60749-29
November 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 29:Latch-up test
A description is not available for this item.

References

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