UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-96902

MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT

inactive
Organization: DLA
Publication Date: 23 December 1997
Status: inactive
Page Count: 20
scope:

This drawing documents five product assurance classes, Class D (lowest reliability), class E, (exceptions), class G (lowest high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation hardness assurance levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes H and K RHA marked devices shall meet the MIL-PRF-38534 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) identify the circuit function as follows:

Device type Generic number Circuit function Access time 01 WMS256K16-35DL SRAM, 256K × 16-bit 35ns 02 WMS256K16-25DL SRAM, 256K × 16-bit 25ns 03 WMS256K16-20DL SRAM, 256K × 16-bit 20ns

This device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device performance documentation D, E, G, H, or K Certification and qualification to MIL-PRF-38534

The case outline(s) are as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style M See figure 1 44 Ceramic SOJ

The lead finish shall be as specified in MIL-PRF-38534.

Supply voltage range (VCC)............................. −0.5 V to +7.0 V Input voltage range.................................... −0.5 to +7.0 V Power Dissapation(PD).................................. 1.6W Storage temperature range.............................. −65° C to +150° C Lead temperature (soldering, 10 seconds)............... +300° C Supply voltage range (VCC)............................. −0.5 V to +7.0 V Data retention........................................ 10 Years minimum Endurance.............................................. 10,000 cycles minimum

Supply voltage range (VCC)............................. +4.5 V dc to +5.5 V dc Input low voltage range (VIL).......................... −0.3 V dc to +0.8 V dc Input high voltage range(VIH).......................... +2.2 V dc Vcc+0.5 V dc Output voltage, high minimum (VOH)..................... +2.4 V dc Output voltage, low maximum (VOL)...................... −0.5 V to +7.0 V Case operating temperature range (TC).................. −55°C to + 125°C

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

October 25, 2004
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
A description is not available for this item.
December 22, 2003
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
A description is not available for this item.
November 3, 2000
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class G (lowered high reliability), class H (high reliability), and class K, (highest...
April 2, 1999
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
This drawing documents five product assurance classes, Class D (lowest reliability), class E, (exceptions), class G (lowest high reliability), class H (high reliability), and class K, (highest...
December 9, 1998
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
This drawing documents five product assurance classes, Class D (lowest reliability), class E, (exceptions), class G (lowest high reliability), class H (high reliability), and class K, (highest...
June 1, 1998
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
This drawing documents five product assurance classes, Class D (lowest reliability), class E, (exceptions), class G (lowest high reliability), class H (high reliability), and class K, (highest...
SMD-5962-96902
December 23, 1997
MICROCIRCUIT, HYBRID, MEMORY, STATIC RANDOM ACCESS MEMORY (SRAM) 256K X 16-BIT
This drawing documents five product assurance classes, Class D (lowest reliability), class E, (exceptions), class G (lowest high reliability), class H (high reliability), and class K, (highest...

References

Advertisement