IEC 61967-6
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz - Part 6: Measurement of Conducted Emissions - Magnetic Probe Method
inactive
Buy Now
Organization: | IEC |
Publication Date: | 1 June 2002 |
Status: | inactive |
Page Count: | 60 |
ICS Code (Integrated circuits. Microelectronics): | 31.200 |
Document History

August 1, 2010
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method CORRIGENDUM 1
A description is not available for this item.

June 1, 2008
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...

March 1, 2008
AMENDMENT 1 Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
A description is not available for this item.

IEC 61967-6
June 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz - Part 6: Measurement of Conducted Emissions - Magnetic Probe Method
A description is not available for this item.