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IEC 61967-6

Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method CORRIGENDUM 1

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Organization: IEC
Publication Date: 1 August 2010
Status: active
Page Count: 1
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

IEC 61967-6
August 1, 2010
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method CORRIGENDUM 1
A description is not available for this item.
June 1, 2008
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...
March 1, 2008
AMENDMENT 1 Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
A description is not available for this item.
June 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz - Part 6: Measurement of Conducted Emissions - Magnetic Probe Method
A description is not available for this item.

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