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IEC 61967-6

Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method CORRIGENDUM 1

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Organization: IEC
Publication Date: 1 August 2010
Status: active
Page Count: 1
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

IEC 61967-6
August 1, 2010
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method CORRIGENDUM 1
A description is not available for this item.
IEC 61967-6
June 1, 2008
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...
IEC 61967-6
March 1, 2008
AMENDMENT 1 Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
A description is not available for this item.
IEC 61967-6
June 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz - Part 6: Measurement of Conducted Emissions - Magnetic Probe Method
A description is not available for this item.

References

This document references:
IEC 61967-4 - Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Published by IEC on March 1, 2021
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
This document is referenced by:
BS EN 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by BSI on June 17, 2003
A description is not available for this item.
This document is referenced by:
BS PD IEC/TR 61967-4-1 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4-1: Measurement of conducted emissions 1 7/150 7 direct coupling method Application guidance to IEC 61967-4
Published by BSI on January 30, 2006
A description is not available for this item.
This document is referenced by:
IEC TS 61967-3 - Integrated circuits – Measurement of electromagnetic emissions – Part 3: Measurement of radiated emissions – Surface scan method
Published by IEC on August 1, 2014
This part of IEC 61967 provides a test procedure which defines an evaluation method for the near electric, magnetic or electromagnetic field components at or near the surface of an integrated circuit...
This document is referenced by:
IEC 61967-5 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 5: Measurement of conducted emissions Workbench Faraday Cage method
Published by IEC on February 1, 2003
This part of IEC 61967 describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on the standardised test-board or on a final printed circuit board...
This document is referenced by:
IEC 62239-1 - Process management for avionics – Management plan – Part 1: Preparation and maintenance of an electronic components management plan
Published by IEC on September 1, 2018
This part of IEC 62239 defines the requirements for developing an electronic components management plan (ECMP) to guarantee to customers that all of the electronic components in the equipment of the...
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