DLA - SMD-5962-96711 REV A
MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, ERROR DETECTION AND CORRECTION UNIT WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 30 September 1997 |
| Status: | inactive |
| Page Count: | 21 |
Document History
June 21, 2000
MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, ERROR DETECTION AND CORRECTION UNIT WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Microcircuits covered by...
February 19, 1999
MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, ERROR DETECTION AND CORRECTION UNIT WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-96711 REV A
September 30, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, ERROR DETECTION AND CORRECTION UNIT WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
December 29, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED ADVANCED CMOS, ERROR DETECTION AND CORRECTION UNIT WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...