JEDEC JESD 35
Procedure for the Wafer-Level Testing of Thin Dielectrics
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| Organization: | JEDEC |
| Publication Date: | 1 January 1992 |
| Status: | inactive |
| Page Count: | 47 |
Document History
April 1, 2001
Procedure for the Wafer-Level Testing of Thin Dielectrics
The revised JESD35 is intended for use in the MOS Integrated Circuit manufacturing industry. It describes procedures developed for estimating the overall integrity and reliability of thin gate...
JEDEC JESD 35
January 1, 1992
Procedure for the Wafer-Level Testing of Thin Dielectrics
A description is not available for this item.