DIN EN 60749-6
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003
inactive
| Organization: | DIN |
| Publication Date: | 1 April 2003 |
| Status: | inactive |
| Page Count: | 7 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
November 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017); German version EN 60749-6:2017
Zweck dieses Teils der IEC 60749 ist es, die Wirkung erhöhter Temperatur auf alle elektronischen Halbleiterbauelemente bei ihrer Lagerung ohne elektrische Beanspruchung zu prüfen und zu bestimmen....
September 1, 2016
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 47/2297/CDV:2016); German Version prEN 60749-6:2016
A description is not available for this item.
DIN EN 60749-6
April 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002); German version EN 60749-6:2003
A description is not available for this item.
References
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