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DLA - SMD-5962-95742 REV A

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, BCD DECADE SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 19 March 1998
Status: inactive
Page Count: 28
intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original... View More

Document History

April 29, 1999
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, BCD DECADE SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 4, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, BCD DECADE SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
SMD-5962-95742 REV A
March 19, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, BCD DECADE SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original...
October 18, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, HIGH SPEED CMOS, BCD DECADE SYNCHRONOUS COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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