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DLA - SMD-5962-96653 REV C

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX INVERTER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 22 September 2003
Status: inactive
Page Count: 20

Document History

June 17, 2019
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX INVERTER, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
July 27, 2010
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, HEX INVERTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96653 REV C
September 22, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX INVERTER, MONOLITHIC SILICON
A description is not available for this item.
August 8, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX INVERTER, MONOLITHIC SILICON
A description is not available for this item.
April 4, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX INVERTER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
December 28, 1995
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, HEX INVERTER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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