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DLA - SMD-5962-77004 REV E

MICROCIRCUIT, DIGITAL, BIPOLAR SCHOTTKY TTL, DECODER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 13 May 2004
Status: inactive
Page Count: 11

Document History

SMD 5962-77004
February 7, 2018
MICROCIRCUIT, DIGITAL, BIPOLAR SCHOTTKY TTL, DECODER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes
SMD-5962-77004 REV E
May 13, 2004
MICROCIRCUIT, DIGITAL, BIPOLAR SCHOTTKY TTL, DECODER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-77004 REV D
August 31, 1987
MICROCIRCUIT, DIGITAL, BIPOLAR SCHOTTKY TTL, DECODER, MONOLITHIC SILICON
A description is not available for this item.

References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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