NPFC - MIL-S-19500/463
SEMICONDUCTOR DEVICE, DIODE, SILICON, CURRENT REGULATOR, TYPES 1N5283-1 THROUGH 115314-1, AND 1N5283UR-1 THROUGH 1N5314UR-1 JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
| Organization: | NPFC |
| Publication Date: | 22 November 1993 |
| Status: | inactive |
| Page Count: | 15 |
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This specification covers the detail requirements for 100 volt, silicon, current regulator diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-S-19500. Two level of product assurance are provided each unencapsulated device type.
See 3.3 (DO-7 and DO-213AB).
Maximum ratings are as shown in table II herein and as follows:
PT = 500 mW (DO-7) at TL = +50°C, L = .375 (9.53 mm); both ends of case or diode body to heat sink at L = .375 (9.53 mm). (Derate to 0 at +175°C).
PT = 500 mW (D0-213AB) at TEC = +125°C. (Derate to 0 at +175°C).
−65°C ≤ Top ≤ +175°C; −65°C ≤ TSTG≤ +175°C.
Primary electrical characteristic are as shown in column 2 of table II herein (nominally 0.22 mA dc ≤ Ip ≤ 4.70 mA dc).
RΘJL = 250°C/W (maximum) at L = .375 inch (9.53 mm) (DO-7), (DO-14)
RΘJEC = 100°C/W (maximum) junction to endcaps (DO-213AB). Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Rome Laboratory ATTN: RL/ERSS 525 Brook Road Griffiss AFB, NY 13441-4505, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
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