NPFC - MIL-PRF-19500/463
SEMICONDUCTOR DEVICE, DIODE, SILICON, CURRENT REGULATOR, TYPES 1N5283-1 THROUGH 1N5314-1, AND 1N5283UR-1 THROUGH 1N5314UR-1 JAN, JANTX, JANTXV, JANS, JANHC, AND JANKC
| Organization: | NPFC |
| Publication Date: | 12 October 1997 |
| Status: | inactive |
| Page Count: | 15 |
scope:
This specification covers the performance requirements for 100 volt, silicon, current regulator diodes. Four levels of product assurance are provided for each encapsulated device type as specified in MIL-PRF-19500. Two level of product assurance are provided each unencapsulated device type.
See 3.3 (D0-7, D0-213AB, and JANC).
Maximum ratings are as shown in table II herein and as follows:
PT = 500 mW (D0-7) at TL = +50°C, L=0.375" (9.53 mm); both ends of case or diode body to heat sink at L=0.375" (9.53 mm). (Derate to 0 at +175°C).
PT = 500 mW (D0-213AB) at TEC = +125°C. (Derate to 0 at +175°C).
−65°C ≤ Top ≤ +175°C; −65°C ≤ TSTG ≤ +175°C.
Primary electrical characteristic are as shown in column 2 of table II herein (nominally 0.22 mA dc ≤ IP ≤ 4.70 mA dc).
RΘJL = 250°C/W (maximum) at L = .375 inch (9.53 mm) (D0-7).
RΘJEC = 100°C/W (maximum) junction to endcaps (D0-213AB). Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Defense Supply Center Columbus ATTN: DSCC-VAT 3990 E. Broad Street Columbus, OH 432165000 by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
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