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ISO 21270

Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale

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Organization: ISO
Publication Date: 1 June 2004
Status: active
Page Count: 20
ICS Code (Chemical analysis): 71.040.40

Document History

ISO 21270
June 1, 2004
Surface chemical analysis X-ray photoelectron and Auger electron spectrometers Linearity of intensity scale
A description is not available for this item.

References

This document is referenced by:
ASTM E2426 - Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS
Published by ASTM on June 1, 2010
This practice provides the Secondary Ion Mass Spectrometry (SIMS) analyst with a method for determining the dead time of the pulse-counting detection systems on the instrument. This practice also...
This document is referenced by:
ISO TS 14101 - Surface characterization of gold nanoparticles for nanomaterial specific toxicity screening: FT-IR method
Published by ISO on November 1, 2012
This Technical Specification provides guidelines for the identification of the surface bound molecules using FT-IR of dehydrated gold nanoparticle (AuNPs) films both before and after nanomaterial...
This document is referenced by:
ASTM E1016 - Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
Published by ASTM on June 1, 2007
The purpose of this guide is to familiarize the analyst with some of the relevant literature describing the physical properties of modern electrostatic electron spectrometers. This guide is intended...
This document is referenced by:
ASTM E2735 - Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Published by ASTM on February 1, 2014
This guide describes an approach to enable users and analysts to determine the calibrations and standards useful to obtain meaningful surface chemistry data with X-ray photoelectron spectroscopy...
This document is referenced by:
ISO 16129 - Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Published by ISO on November 1, 2018
This document is designed to allow the user to assess, on a regular basis, several key parameters of an X‑ray photoelectron spectrometer. It is not intended to provide an exhaustive performance...
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