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DLA - SMD-5962-88739 REV D

MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 29 March 1993
Status: inactive
Page Count: 22
scope:

This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices".

The complete PIN shall be as shown in the following example:

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function Multiply time 01 TMC208KV Two's complement 8 × 8 multiplier 70 ns 02 IMC208KV1 Two's complement 8 × 8 multiplier 50 ns 03 TMC28KUV Unsigned magnitude 8 × 8 multiplier 70 ns 04 TMC28KUV1 Unsigned magnitude 8 × 8 multiplier 50 ns 05 LMU0860 Two's complement 8 × 8 multiplier 60 ns 06 LMU0845 Two's complement 8 × 8 multiplier 45 ns 07 LMU8U60 Unsigned magnitude 8 × 8 multiplier 60 ns 08 LMU8U45 Unsigned magnitude 8 × 8 multiplier 45 ns

The case outline(s) shall be as designated in appendix C of MIL-M-38510, and as follows:

Outline letter Case outline Q D-5 (40-lead, 2.096" × .620" × .225"), dual-in-line package X C-5 (44-lead, .662" × .662" × .120"), leadless chip carrier

Supply voltage range (VDD) - - - - - - - - - - - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc DC voltage applied to outputs Devices 01, 02, 03, 04 - - - - - - - - - - - - - - - - - - - - - - - - - −0.5 V dc to VDD + 0.5 V dc Devices 05, 06, 07, 08 - - - - - - - - - - - - - - - - - - - - - - - - - −3.0 V dc to +7.0 V dc DC input voltage: Devices 01, 02, 03, 04 - - - - - - - - - - - - - - - - - - - - - - - - - −0.5 V dc to VDD + 0.5 V dc Devices 05, 06, 07, 08 - - - - - - - - - - - - - - - - - - - - - - - - - −3.0 V dc to +7.0 V dc Maximum power dissipation 1/ - - - - - - - - - - - - - - - - - - - - - - - - 550 mW Lead temperature (soldering, 10 seconds) - - - - - - - - - - - - - - - - - - +300°C Thermal resistance, junction-to-case (ΘJC) - - - - - - - - - - - - - - - - See MIL-M-38510, appendix C Junction temperature (TJ) - - - - - - - - - - - - - - - - - - - - - - - - - +175°C Storage temperature range - - - - - - - - - - - - - - - - - - - - - - - - - −65°C to +150°C

Supply voltage (VDD) - - - - - - - - - - - - - - - - - - - - - - - - - - - - +4.5 V dc to +5.5 V dc Output high current (IOH) - - - - - - - - - - - - - - - - - - - - - - - - - −2.0 mA maximum Output low current (IOL) Devices 01, 02, 03, 04 - - - - - - - - - - - - - - - - - - - - - - - - - 4.0 mA maximum Devices 05, 06, 07, 08 - - - - - - - - - - - - - - - - - - - - - - - - - 8.0 mA maximum Case operating temperature range (TC) - - - - - - - - - - - - - - - - - - - −55°C to +125°C

intended Use:

Microcircuits conforming to this drawing are intended for use when military specifications do not exist and qualified military devices that will perform the required function are not available for... View More

Document History

SMD 5962-88739
April 14, 2020
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
SMD-5962-88739 REV G
August 15, 2005
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-88739 REV F
May 30, 2000
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-88739 REV E
September 25, 1996
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88739 REV D
March 29, 1993
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-88739 REV C
September 11, 1992
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88739 REV B
June 19, 1992
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88739 REV A
October 18, 1991
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-88739
November 7, 1988
MICROCIRCUIT, DIGITAL, CMOS, 8 X 8 MULTIPLIER, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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