DLA - SMD-5962-90758 REV A
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL 2-BIT BISTABLE TRANSPARENT LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 23 February 2006 |
| Status: | inactive |
| Page Count: | 13 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
May 31, 2023
MICROCIRCUIT, DIGITAL, , HIGH SPEED CMOS, DUAL 2-BIT BISTABLE TRANSPARENT LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Replaceability....
February 23, 2017
MICROCIRCUIT, DIGITAL, , HIGH SPEED CMOS, DUAL 2-BIT BISTABLE TRANSPARENT LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
July 25, 2012
MICROCIRCUIT, DIGITAL, , HIGH SPEED CMOS, DUAL 2-BIT BISTABLE TRANSPARENT LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-90758 REV A
February 23, 2006
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL 2-BIT BISTABLE TRANSPARENT LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
April 24, 1991
MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL 2-BIT BISTABLE TRANSPARENT LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...