IEEE 4
Amendment to IEEE Standard Techniques for High-Voltage Testing
| Organization: | IEEE |
| Publication Date: | 17 March 2001 |
| Status: | inactive |
| Page Count: | 12 |
scope:
Foreword
This revision of IEEE Standard Techniques for High-Voltage Testing is notable for its implementation of many new procedures to improve accuracy, provide greater flexibility, and address practical problems associated with high-voltage measurements. Users of this document are urged to study it carefully to learn about the differences between it and previous versions. A significant effort has been made to clarify some of the techniques that may have been difficult to interpret, eliminate methods that are not technically sound, and provide the user with sufficient guidance.
Scope
This standard is applicable to
a) Dielectric tests with direct voltages
b) Dielectric tests with alternating voltages
c) Dielectric tests with impulse voltages
d) Tests with impulse currents
e) Tests with combinations of the above
f) Capacitance and dielectric loss measurements
This standard is applicable only to tests on equipment with a rated voltage above 1000 V.
Procedures are given for applying correction factors to convert test data to standard atmospheric conditions.
This standard also specifies procedures for testing equipment when external insulation of the test object is to be subjected to dry, wet, or contaminated conditions.
Document History