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DLA - SMD-5962-91610

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 1 November 1991
Status: inactive
Page Count: 19
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 54ACT823 9-bit D flip-flop, positive edge triggered, TTL compatible input, three-state outputs

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.

Outline letter Case outline K F-6 (24-lead, .640" × .420" × .090"), flat package L F-5 (24-lead, 1.280" × .310" × .200"), dual-in-line package 3 C-4 (28-lead, .460" × .460" × .100"), square chip carrier package

The Lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range - - - - - - - - - - - - - - - −0.5 V dc to +6.0 V dc DC input voltage range - - - - - - - - - - - - - - −0.5 V dc to VCC +0.5 V dc DC output voltage range - - - - - - - - - - - - - −0.5 V dc to VCC + 0.5 V dc Clamp diode current - - - - - - - - - - - - - - - ±20 mA DC output current (per output pin) - - - - - - - - ±50 mA DC VCC or GND current (per output pin) - - - - - - ±50 mA Storage temperature range - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) - - - - - - - - - - 500 mW Lead temperature (soldering, 10 seconds) - - - - - +300°C Thermal resistance, junction-to-case (ΘJC) - - - - See MIL-M-38510, appendix C junction temperature (TJ) 2/ - - - - - - - - - - - +175°C

Supply voltage (VCC) - - - - - - - - - - - - - - - 4.5 V dc to 5.5 V dc Case operating temperature range (TC) - - - - - - −55°C to 125°C Input voltage range (VIN) - - - - - - - - - - - - 0.0 V dc to VCC Output voltage range (VOUT) - - - - - - - - - - - 0.0 V dc to VCC Input rise or fall times: VCC = 4.5 V to 5.5 V - - - - - - - - - - - - - - 0 to 8 ns/V Minimum setup time, date (Dn) to clock (CP) (ts1): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 3.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 4.0 ns Minimum setup time, enable ([E bar][N bar]) to clock (CP) (ts2): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 3.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 4.0 ns Minimum hold time, Dn to CP (th1): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 2.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 3.0 ns Minimum hold time [E bar][N bar] to CP (th2): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 2.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 3.0 ns Minimum CP high, low, pulse width (tw1): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 5.0 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 6.0 ns Minimum clear ([C bar][L bar][R bar]) pulse width (tw2): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 6.0 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 7.0 ns Minimum recovery time, CLR to CP (trec): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 4.0 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 4.5 ns Maximum clock frequency (fMAX): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 95 MHz TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 95 MHz

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - XX percent 3/

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

October 23, 2020
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Scope. This draw ing documents tw o product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead...
August 6, 2013
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
January 24, 2007
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 1, 2006
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-91610
November 1, 1991
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

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