DLA - SMD-5962-91610
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 9-BIT D FLIP-FLOP, POSITIVE EDGE TRIGGERED, WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
| Organization: | DLA |
| Publication Date: | 1 November 1991 |
| Status: | inactive |
| Page Count: | 19 |
scope:
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.
The PIN shall be as shown in the following example:
Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
The device type(s) shall identify the circuit function as follows:
Device type Generic number Circuit function 01 54ACT823 9-bit D flip-flop, positive edge triggered, TTL compatible input, three-state outputs
The device class designator shall be a single letter identifying the product assurance level as follows:
Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535
For device classes M, B, and S, case outline(s) shall meet the requirements in appendix C of MIL-M-38510 and as listed below. For device classes Q and V, case outline(s) shall meet the requirements of MIL-I-38535, appendix C of MIL-M-38510, and as listed below.
Outline letter Case outline K F-6 (24-lead, .640" × .420" × .090"), flat package L F-5 (24-lead, 1.280" × .310" × .200"), dual-in-line package 3 C-4 (28-lead, .460" × .460" × .100"), square chip carrier package
The Lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.
Supply voltage range - - - - - - - - - - - - - - - −0.5 V dc to +6.0 V dc DC input voltage range - - - - - - - - - - - - - - −0.5 V dc to VCC +0.5 V dc DC output voltage range - - - - - - - - - - - - - −0.5 V dc to VCC + 0.5 V dc Clamp diode current - - - - - - - - - - - - - - - ±20 mA DC output current (per output pin) - - - - - - - - ±50 mA DC VCC or GND current (per output pin) - - - - - - ±50 mA Storage temperature range - - - - - - - - - - - - −65°C to +150°C Maximum power dissipation (PD) - - - - - - - - - - 500 mW Lead temperature (soldering, 10 seconds) - - - - - +300°C Thermal resistance, junction-to-case (ΘJC) - - - - See MIL-M-38510, appendix C junction temperature (TJ) 2/ - - - - - - - - - - - +175°C
Supply voltage (VCC) - - - - - - - - - - - - - - - 4.5 V dc to 5.5 V dc Case operating temperature range (TC) - - - - - - −55°C to 125°C Input voltage range (VIN) - - - - - - - - - - - - 0.0 V dc to VCC Output voltage range (VOUT) - - - - - - - - - - - 0.0 V dc to VCC Input rise or fall times: VCC = 4.5 V to 5.5 V - - - - - - - - - - - - - - 0 to 8 ns/V Minimum setup time, date (Dn) to clock (CP) (ts1): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 3.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 4.0 ns Minimum setup time, enable ([E bar][N bar]) to clock (CP) (ts2): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 3.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 4.0 ns Minimum hold time, Dn to CP (th1): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 2.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 3.0 ns Minimum hold time [E bar][N bar] to CP (th2): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 2.5 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 3.0 ns Minimum CP high, low, pulse width (tw1): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 5.0 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 6.0 ns Minimum clear ([C bar][L bar][R bar]) pulse width (tw2): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 6.0 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 7.0 ns Minimum recovery time, CLR to CP (trec): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 4.0 ns TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 4.5 ns Maximum clock frequency (fMAX): TC = +25°C, VCC = 4.5 V - - - - - - - - - - - - 95 MHz TC = −55°C, +125°C, VCC = 4.5 V - - - - - - - - 95 MHz
Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) - - - - XX percent 3/
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
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