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DLA - SMD-5962-96684 REV A

MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4X4 MULTIPORT REGISTER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 10 June 1998
Status: inactive
Page Count: 26
scope:

This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535 and the manufacturers approved QM plan for use in monolithic microcircuits, multichip modules (MCMs), hybrids, electronic modules, or devices using chip and wire designs in accordance with MIL-PRF-38534 are specified herein. Two product assurance classes consisting of military high reliability (device class Q) and space application (device Class V) are reflected in the Part or Identification Number (PIN). When available a choice of Radiation Hardiness Assurance (RHA) levels are reflected in the PIN.

intended Use:

Microcircuit die conforming to this drawing are intended for use in microcircuits built in accordance with MIL-PRF-38535 or MIL-PRF-38534 for government microcircuit applications (original... View More

Document History

June 6, 2000
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4X4 MULTIPORT REGISTER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD-5962-96684 REV A
June 10, 1998
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4X4 MULTIPORT REGISTER, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
January 9, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4X4 MULTIPORT REGISTER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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