DLA - SMD-5962-96633 REV C
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
inactive
| Organization: | DLA |
| Publication Date: | 2 July 2003 |
| Status: | inactive |
| Page Count: | 24 |
Document History
June 24, 2019
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
August 23, 2010
MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96633 REV C
July 2, 2003
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
A description is not available for this item.
August 4, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
A description is not available for this item.
February 28, 1997
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
January 4, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, QUAD CLOCKED D LATCH, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...