IEC 61709
Electronic Components - Reliability - Reference Conditions for Failure Rates and Stress Models for Conversion
inactive
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| Organization: | IEC |
| Publication Date: | 1 October 1996 |
| Status: | inactive |
| Page Count: | 94 |
| ICS Code (Electronic components in general): | 31.020 |
scope:
This International Standard gives guidance on the use of failure rate data for the reliability prediction of components in electronic equipment. Reference conditions for failure rate data are specified, so that data from different sources can be compared on a uniform basis. If failure rate data are given in accordance with this standard then no additional information on the specified conditions is required.
The stress models described in this standard should be used as a basis for conversion of the failure rate data at reference conditions to the actual operating conditions. Conversion of failure rate data are only permissible within the specified functional limits of the components.
Document History
October 1, 2019
ELECTRIC COMPONENTS – RELIABILITY – REFERENCE CONDITIONS FOR FAILURE RATES AND STRESS MODELS FOR CONVERSION
A description is not available for this item.
February 1, 2017
Electric components – Reliability – Reference conditions for failure rates and stress models for conversion
This document gives guidance on the use of failure rate data for reliability prediction of electric components used in equipment.
The method presented in this document uses the concept of reference...
June 1, 2011
Electric components – Reliability – Reference conditions for failure rates and stress models for conversion
This International Standard gives guidance on how failure rate data can be employed for reliability prediction of electric components in equipment. Reference conditions are numerical values of...
IEC 61709
October 1, 1996
Electronic Components - Reliability - Reference Conditions for Failure Rates and Stress Models for Conversion
This International Standard gives guidance on the use of failure rate data for the reliability prediction of components in electronic equipment. Reference conditions for failure rate data are...