IEC 60749-18
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
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| Organization: | IEC |
| Publication Date: | 1 December 2002 |
| Status: | inactive |
| Page Count: | 36 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
April 1, 2019
Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)
This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total...
IEC 60749-18
December 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
A description is not available for this item.