DLA - MIL-S-19500/117K
SEMICONDUCTOR DEVICE, DIODE, SILICON TYPES 1N962E-1 THROUGH 1N992E-1, 1N962BUR-1 THROUGH lN992EUR-1, 1N962C-1 THROUGH 1N992C-1, 1N962CUR-1 THROUGH 1N992CUR-1, 1N962D-1 THROUGH 1N992D-1 , 1N962DUR-1 THROUGH 1N992DUR-I , JAN, JANTX, JANTXV, AND JANHC
| Organization: | DLA |
| Publication Date: | 15 March 1994 |
| Status: | inactive |
| Page Count: | 18 |
scope:
This specification covers the detail requirements for 500 milliwatt, silicon, voltage regulator diodes having voltage tolerances of 5 percent, 2 percent, and 1 percent. Three levels of product assurance are provided for each device type as specified in MIL-S-19500. One level of product assurance is provided for die.
See 3.3.
Maximum ratings are as shown in table IV herein and as follows:
PT = 500 mW (D0-35) at TL = +50°C, L = .375 (9.53 mm); both ends of case or diode body to heat sink at L = .375 (9.53 mm). (Derate IZ to 0.0 mA dc at +175°C).
PT = 500 mW (D0-213AA) at TEC = +125°C (derate to 0 at +175°C).
−65°C ≥ Top ≥ +175°C; −65°C ≥ TSTG ≥ +175°C.
Primary electrical characteristic are shown in columns 2, 9, 12, and 14 of table IV herein and as follows:
11 V dc ≥ Vz ≥ 200 V dc 1N962B-1 through 1N992B-1 are 5 percent voltage tolerance. 1N962C-1 through 1N992C-1 are 2 percent voltage tolerance. 1N962D-1 through 1N992D-1 are 1 percent voltage tolerance. RΘJL = 250°C/W (maximum) at L = .375 inch (9.53 mm) (D0-35). RΘJEC = 100°C/W (maximum) junction to endcaps (D0-213AA).
Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander, Defense Electronics Supply Center, ATTN: DESC-ELDT, 1507 Wilmington Pike, Dayton, OH 45444-5765, by using the Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.
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