IEC 60444-2
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
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| Organization: | IEC |
| Publication Date: | 1 January 1980 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
IEC 60444-2
January 1, 1980
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
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