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IEC 60444-2

Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units

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Organization: IEC
Publication Date: 1 January 1980
Status: active
Page Count: 22
ICS Code (Piezoelectric devices): 31.140

Document History

IEC 60444-2
January 1, 1980
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
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References

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