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BSI - BS EN 60444-8

Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units

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Organization: BSI
Publication Date: 31 May 2017
Status: active
Page Count: 22
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN 60444-8
May 31, 2017
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
A description is not available for this item.
BS EN 60444-8
November 19, 2003
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
A description is not available for this item.

References

This document references:
IEC 60444-5 - Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by IEC on May 1, 1995
A description is not available for this item.
This document references:
IEC 60444-7 - Measurement of quartz crystal unit parameters . Part 7: Measurement of activity and frequency dips of quartz crystal units
Published by IEC on April 1, 2004
A description is not available for this item.
This document references:
IEC 60122-1 - Quartz crystal units of assessed quality – Part 1: Generic specification
Published by IEC on December 1, 2017
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
EN 60444-2 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
IEC 60444-6 - Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
Published by IEC on June 1, 2013
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based...
This document references:
EN 60444-2 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
Published by CENELEC on April 1, 1997
A description is not available for this item.
This document references:
IEC 60122-1 - Quartz crystal units of assessed quality – Part 1: Generic specification
Published by IEC on December 1, 2017
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 60444-6 - Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
Published by IEC on June 1, 2013
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based...
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