CENELEC - EN 60444-2
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 April 1997 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Piezoelectric devices): | 31.140 |
Document History
EN 60444-2
April 1, 1997
Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
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