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BSI - BS EN 60444-8

Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units

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Organization: BSI
Publication Date: 19 November 2003
Status: inactive
Page Count: 14
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN 60444-8
May 31, 2017
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
A description is not available for this item.
BS EN 60444-8
November 19, 2003
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
A description is not available for this item.

References

This document references:
IEC 60444-2 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a PI-Network Part 2: Phase Offset Method for Measurement of Motional Capacitance of Quartz Crystal Units
Published by IEC on January 1, 1980
A description is not available for this item.
This document references:
IEC 60444-5 - Measurement of Quartz Crystal Unit Parameters - Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by IEC on May 1, 1995
A description is not available for this item.
This document references:
BS EN 60444-5 - Measurement of Quartz Crystal Unit Parameters Part 5: Methods for the Determination of Equivalent Electrical Parameters Using Automatic Network Analyzer Techniques and Error Correction
Published by BSI on October 15, 1995
A description is not available for this item.
This document references:
IEC 61240 - Piezoelectric devices – Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection – General rules
Published by IEC on October 1, 2016
This International Standard sets out general rules for drawing all dimensional and geometrical characteristics of a surface-mounted piezoelectric device package (referred to in this document as SMD)...
This document references:
IEC 60444-1 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network
Published by IEC on January 1, 1986
A description is not available for this item.
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