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IEC 62373

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

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Organization: IEC
Publication Date: 1 July 2006
Status: active
Page Count: 36
ICS Code (Semiconductor devices): 31.080
scope:

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

 

Document History

IEC 62373
July 1, 2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).  

References

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