IEC 62373
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
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| Organization: | IEC |
| Publication Date: | 1 July 2006 |
| Status: | active |
| Page Count: | 36 |
| ICS Code (Semiconductor devices): | 31.080 |
scope:
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).
Document History
IEC 62373
July 1, 2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).